@prefix ns0: <http://gcmd.gsfc.nasa.gov/kms#> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .

<https://gcmd.earthdata.nasa.gov/kms/concept/dc965068-fe7b-42bd-84cf-9b251b2397ea>
  ns0:altLabel [ ] ;
  skos:definition """Secondary Ion Mass Spectrometers (SIMS) are mass spectrometric
techniques that are useful for the identification of polymer
surfaces and fiber/polymer interfaces by the detection of ionic
group clusters that are characteristic of specific polymers."""@en ;
  skos:prefLabel "SIMS"@en ;
  skos:inScheme <https://gcmd.earthdata.nasa.gov/kms/concepts/concept_scheme/instruments> ;
  skos:broader <https://gcmd.earthdata.nasa.gov/kms/concept/ecd58f82-8f96-45e1-9547-dd4a02291bd9> ;
  a skos:Concept .

<https://gcmd.earthdata.nasa.gov/kms/concept/ecd58f82-8f96-45e1-9547-dd4a02291bd9>
  skos:prefLabel "Spectrometers/Radiometers"@en ;
  a skos:Concept ;
  skos:narrower <https://gcmd.earthdata.nasa.gov/kms/concept/dc965068-fe7b-42bd-84cf-9b251b2397ea> .